In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

We introduce a new approach aiming at computing approximate optimal designs for multivariate polynomial regressions on compact (semialgebraic) design spaces. We use the moment-sum-of-squares hierarchy ...

This course is available on the Global MSc in Management, Global MSc in Management (CEMS MIM), Global MSc in Management (MBA Exchange), MSc in Applied Social Data Science, MSc in European and ...

Motivated by recent analyses of data in biomedical imaging studies, we consider a class of image-on-scalar regression models for imaging responses and scalar predictors. We propose using flexible ...